Chinese translation for "delay fault"

延迟故障

Related Translations:

fault structure:  断层构造

amplitude delay:  振幅延迟

balance delay:  平衡迟误

delay helix:  螺旋延迟线

delay penalty:  延误判罚逾期罚款

eliminating delays:  消除迟误

delayed instability:  延迟不稳定性

packet delay:  包延迟报文分组时延

processing delay:  处理延迟

delay slot:  延迟槽

Example Sentences:

	1.	In addition , appropriate current testing methods for delay fault which is hard to detect are also discussed 此外,针对较难检测的延迟故障,专门讨论了适合于延迟故障检测的电流测试方法。
	2.	An automatic test pattern generation ( atpg ) algorithm for deliberately selected delay faults is presented to cope with the crosstalk - induced delay effects on longer paths 由于电路中较长的通路具有较短的松弛时间，因此容易因为串扰问题产生时延故障。
	3.	It combines boolean algebra expression with time information to describe behavior of a digital circuit . it has made substantive progress at path sensitization , power dissipation estimation , iddt and delay fault diagnosis . theoretically , it is necessary to establish some mathematical foundation in order to define distance , limit and continuity based on boolean process 它将布尔代数与时间结合起来，为异步性描述提供了比较形式的理论基础，并在通路敏化、电源消耗的计算、动态电流测试方法( i _ ( ddt ) ) 、时延故障诊断等方面取得了实质性的进展。
	4.	For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing 为了便于测试,我们将生产过程中集成电路出现的多种多样的缺陷抽象为各种模型。目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。电压测试主要针对固定型故障模型,多年的研究也取得了令人满意的结果; cmos电路中的桥接故障则宜用稳态电流测试方法( iddq )测试;对于电压和稳态电流难以测试的开路故障,可以使用瞬态电流测试( iddt )的方法进行测试。

Similar Words：

"delay error" Chinese translation, "delay errors" Chinese translation, "delay evaluation" Chinese translation, "delay exclusion" Chinese translation, "delay factor" Chinese translation, "delay feature" Chinese translation, "delay ff" Chinese translation, "delay filter" Chinese translation, "delay filtering" Chinese translation, "delay firing pinpiston" Chinese translation